Sensofar S wide

Surface metrology for large sample areas up to 300x300mm

3D optical surface metrology system capable of measuring large areas up to 300x300mm: a digital microscope integrated into a high-resolution measuring instrument.

Rapidly measure large sample areas up to 300 x 300 mm. It provides all the benefits of a digital microscope integrated into a high resolution measuring instrument. Extremely easy-to-use with one single button acquisition. 

  • Fringe Projection technology permits extended measurements.
  • Measures shape, contour and roughness.

Key Information

Capable of measuring large areas up to 300x300mm

GD&T

Straightness