WAVELINE - Roughness and Contour Metrology

Take advantage of exclusive  discounts on our roughness and contour measuring systems.

Are you looking for the optimum measuring system for roughness and contour measurement? Take advantage of our promotion now and receive up to 18% discount on selected Jenoptik measuring systems.

When you buy the top of the range model for combined roughness and contour measurement technology, the Waveline T8000 RC120-400 Digiscan you will save over £10,000!

  • Flexible roughness measurement over the entire traverse length of 120mm
  • state of the art digital contour measurement
  • Simple operation using probe arms with electronic identification

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Tactile roughness measurement

  • Roughness parameters
  • Core roughness parameters
  • Profile parameters
  • Waviness parameters
  • Motif parameters
  • JIS parameters
  • Topography evaluation
  • Dominant waviness
  • Twist parameters
Tactile contour measurement

  • Angle
  • Radius
  • Distance
  • Parallelism
  • Crowning
  • Gothic arcs
  • Edge geometries
  • Line profile
  • Threads
  • Diameter
Optical surface inspection

  • Crosshatch angles
  • Area of blowholes
  • Radius
  • Laser honing structures
Surface roughness measurement on a wide range of surfaces
Jenoptik Waveline Roughness and Contour Metrology by Metrology Direct
Wide range of evaluation possibilities in contour measurement
Jenoptik Waveline Roughness and Contour Metrology by Metrology Direct
Jenoptik Waveline Rouaghness and Contour Metrology by Metrology Direct
Roughness measurement
Jenoptik Waveline Rouaghness and Contour Metrology by Metrology Direct
Contour measurement
Jenoptik Waveline Roughness and Contour Metrology by Metrology Direct
Combined roughness and contour measurement
Jenoptik Waveline Roughness and Contour Metrology by Metrology Direct
Surface inspection

Get better measurements

… with versatility

Whether mobile or stationary, manual or automated, for simple or complex measuring tasks – we supply you with measuring systems that are tailored to your needs.

… in day-to-day operations

Our robust and high-precision solutions provide absolutely precise results in environments close to production. Our systems are easy to operate thanks to an intuitive software interface.

… with flexibility

The WAVELINE systems can be optimally configured to suit a wide range of requirements as needed, with exchangeable probe arms and a comprehensive range of accessories. As a result, these systems are also suitable for different measuring tasks on flexible production lines

… with professional metrology

WAVELINE solutions are the direct result of decades of experience and extensive expertise. They stand out from other products on the market thanks to measurements performed in accordance with international standards, simple operation, and professional evaluation of the measured values.

… with modern technology

Mobile WAVELINE solutions feature wireless Bluetooth® technology allowing an almost limitless range of applications. In contour measurement, digital probing systems ensure reliable measurement results without analog limitations.

… with innovative probing systems

Thanks to intelligent probing systems, the correct measuring conditions are automatically set for contour measurements. It is also possible to measure with dual tip probe arms for top/bottom measurements.

Mobile roughness measuring instruments

Hommel-Etamic W5 Roughness & Form Measurement

HOMMEL-ETAMIC W5

Small but powerful - portable, reliable roughness measurement
Hommel-Etamic W10 Roughness & Form Measurement

HOMMEL-ETAMIC W10

Flexible, precise roughness measurement without boundaries
Hommel-Etamic W20 Roughness & Form Measurement

HOMMEL-ETAMIC W20

Mobile roughness, waviness and profile measurement in production

Control and evaluation software for mobile roughness measuring systems

Hommel-Etamic Evovis mobile Roughness & Form Software Measurement

HOMMEL-ETAMIC EVOVIS mobile

 

Professional evaluation and simple operation of mobile measuring instruments

Stationary roughness and/or contour measurement with separate probing systems

Hommel-Etamic T800R Roughness & Form Measurement

HOMMEL-ETAMIC T8000R

Universally applicable roughness measuring system
Hommel-Etamic T800RC Roughness & Form Measurement

HOMMEL-ETAMIC T8000 RC

Combined roughness and contour systems

Combined roughness and contour measurement with one probing system

Hommel-Etamic surfscan Roughness & Form Measurement

HOMMEL-ETAMIC surfscan

High resolution roughness and contour measurement in one run
Hommel-Etamic nanoscan Roughness & Form Measurement

HOMMEL-ETAMIC nanoscan 855

Simultaneous roughness and contour measurement in the nanometer range

Control and evaluation software for stationary surface measuring systems

Hommel-Etamic Evovis Roughness & Form Software Measurement

HOMMEL-ETAMIC EVOVIS

EVOVIS - evaluation software for roughness and contour

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