3D Profiling

Three Vision Technologies In One System

S neox 3D Profiling Microscope 
MANUFACTURED AND DESIGNED IN BARCELONA BY OUR PARTNER SENSOFAR

FOR ROUGHNESS, SURFACES FINISH, FLATNESS AND WAVINESS MEASUREMENT OF THIN FILMS, WAFERS, SHINY SURFACES.

ACCURATE TO THE NANOMETER

Request a Demonstration

Want to see the system in action? Contact us to arrange a demo.

Speak To A Metrology Expert

Want to discuss your Metrology challenges and more about this system or others we are able to offer? Arrange for one of our experts to meet with you at your site.

Sensofar S neox
3D Profiler with 3 different technologies for data capture.

Using 3 technologies in 1: Confocal, Interferometry, Ai Focus Variation

Versatile System for Quality Control and R&D

High speed 3D profiling

Ai Focus Variation

Saving each layer as the lens moves upward allowing you to see shape and curvature.

Confocal

Only allowing focused light through allowing you to see surface structure.

Interferometry

Using a laser allows very accurate measurement down to nanometers great for shiny surfaces such as wafers.

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Quality Control

Automated modules have been created to facilitate all QC procedures. 

Fast

Data acquisition is taken at 180 fps. Standard measurement acquisition is 5X faster than before. Making the S neox the fastest areal measurement system in the market.

Easy To Use

Now in it’s 5th generation, the S neox has been designed to be easy to use, intuitive and faster. Even if you are beginner user, the system can be managed with just one click. 

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Research & Development

Ideal for all lab environments, without limitations. The three measurement techniques found in the S neox sensor head –Confocal, Interferometry, Ai Focus Variation– each contribute critically to the versatility of the system. 

Thin Film

Thin film measurement technique measures the thickness of optically transparent layers quickly, accurately, non-destructively and requires no sample preparation. Transparent films from 50 nm to 1.5 μm can be measured in less than one second. Sample evaluation spot diameter is dependent on the objective magnification which can be as low as 0.5 μm and up to 40 μm.

High Resolution

Sensofar proprietary algorithms deliver nanometer level system noise for any measurements technique at the highest possible lateral resolution for an optical instrument.
The topography shown is a subnanometer (0.3 nm) atomic layer. Courtesy of PTB.

 

 

 

Extended Measurements Module

SensoSCAN’s extended measurements module allows the user to easily define the measurement layout on the surface by means of the overview image. The area can be automatically cropped to rectangular, circular or ring areas of interest. Wide areas up to 500 million pixels are possible. Several scanning strategies such us autofocusing on each field, or focus tracking to minimise vertical scanning range are available.

S NEOX 3D PROFILER

See it in action in our video

See More From The Sensofar Range

S wide

LARGE AREA 3D OPTICAL
METROLOGY SYSTEM

Fringe Projection technology
Extended measurements
Shape, contour and roughness

 

S neox Five Axis

COMPLETE 3D
MEASUREMENT SOLUTION

4-in-1 technologies:
Confocal, Ai Focus Variation, Interferometry and Thin Film

Provides all the S neox features
and capabilities, with five axis

Rotational stage (complete 3D volumetric measurement)

S lynx

COMPACT 3D
SURFACE PROFILER

3-in-1 technologies: Confocal,
Focus Variation, Interferometry

Single measurements

See The S neox In Action. Request a Demo.

Opticline T3D Demo Request

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