Versatile systems able to measure different textures, structures, roughness and waviness across varying surface scales. For a broad range of high-end surface measurement microscope applications.
High quality non-contact 3D surface profilers based on complementary confocal, interferometry, focus variation and spectroscopy reflectometer techniques.
Spectroscopic reflectometry
For transparent layers samples, taking thickness measurements
in a quick, accurate and non-destructive way.
Fringe projection
For large measurements, providing high vertical accuracy and repeatability without noise disruption.
With applications in the following industries:
The Sensofar optical profiler range utilises 4 technologies in one system.
Five Axis 3D optical surface profiler with 4 microscope technologies in 1 for full 3D measurement.
Let us solve your measuring challenges.
