Versatile systems able to measure different textures, structures, roughness and waviness across varying surface scales. For a broad range of high-end surface measurement microscope applications.
High quality non-contact 3D surface profilers based on complementary confocal, interferometry, focus variation and spectroscopy reflectometer techniques.
For transparent layers samples, taking thickness measurements
in a quick, accurate and non-destructive way.
For large measurements, providing high vertical accuracy and repeatability without noise disruption.
With applications in the following industries:
The Sensofar optical profiler range utilises 3 technologies in one system.