3D optical surface metrology system capable of measuring large areas up to 300x300mm: a digital microscope integrated into a high-resolution measuring instrument. The field of view is 34.7 x 29.1mm offering a large area without need for any stitching.

Rapidly measure large sample areas up to 300 x 300 mm. It provides all the benefits of a digital microscope integrated into a high resolution measuring instrument. Extremely easy-to-use with one single button acquisition. 

Fringe Projection technology permits extended measurements.
Measures shape, contour and roughness.

These systems are used for fast non contact surface measurements and can also be integrated in to a cell as just the sensorhead.

• Sub-micron height repeatability over the entire extended area.
• One-shot height measurement up to 40 mm without Z scanning.
• Bi-telecentric lenses with very low field distortion providing accurate metrology traceability.
• Traceability: Every S wide is manufactured to deliver accurate and traceable measurements. Systems are calibrated using traceable standards according to ISO 25178 and VDI 2634-2.
• Form deviation from 3D CAD models provides the geometric difference and tolerance measurement.
• New digital zoom function features a 5MPx colour camera along with digital zoom capabilities, capturing a variety of details on your expected parts.
• A large suite of analysis tools that extracts every piece of measured data, including – roughness, flatness, critical dimensions, GD&T, and CAD comparisons. 
• Measure oversized components or large volumes of samples with super quick data capture,  flexible setups and built-in automation tools.