• Bearing industries: Sleeve bearing, slider bearing and ball bearing.

The W800/W900 measuring systems can be combined with different probe systems to undertake challenging roughness and contour measurement tasks. We offer the right solution to suit all performance requirements.

Available probe systems:

• TKU400: Roughness measurement – universally for the measurement of surface roughness, waviness and micro contours.

• Digiscan: Contour measurement – The Digiscan contour probe system with state-of-the-art technology offers users safe and easy operation as well as absolutely reliable measurement results.
• Surfscan: Roughness & contour measurement – High-resolution roughness measurement.
• Nanoscan: Roughness & contour measurement – Ultra-precise opto-mechanical probe system.

Product Variants

• W900: High accuracy fast contour and measurement in a stand-alone system.
• W10/20: Mobile surface roughness measurement and waviness measurement systems.
• W5: Handheld mobile roughness measuring tool.

Evovis Software:

Powerful and easy to use contour and roughness measurement software.

Measurement and evaluation software for roughness and contour measurement results.

• Standardised user interface.
• Easy-to-understand control logic and extensive support functions for designing individual measurement applications, test plans & print forms. 
• Its applications range from simple measurements of a single characteristic to fully automated measurement applications within the Industry 4.0 environment.
• Measuring station control with live display.
• Automatic system configuration when changing the probe system or probe arm.
• Extensive statistical functions.
• Interactive analysis and evaluation functions.
• All globally standardised surface parameters for primary, roughness and waviness profiles.
• Professional contour evaluation with evaluation of geometric dimensions, tolerance evaluation of profiles and extensive functions to evaluate profile form deviations.
• Simple definition of automated measuring and evaluation processes.

Waveline Roughness, Contour Brochure