The Jenoptik Waveline 600 is a bench-top modular measuring probe system, designed for precise roughness and contour measurements.
Easy to use with manual height adjustment for precise probe positioning, and optional mounting base plates with quick change adapter (QCA) for fast probe changeover.
Expertly developed for complex professional roughness and contour measuring tasks in an industrial manufacturing process setting.
Available as with the following probe configurations:
Available probe systems:
Powerful and easy-to-use contour and roughness measurement software.
Measurement and evaluation software for roughness and contour measurement results.