Precise mobile roughness measuring, waviness and profile measurement on the shop floor, with a skidless probe system.

The skidless probe system has been designed specifically for mobile roughness measurement. It not only measures all common roughness parameters but also evaluates the waviness and total profile of your workpiece surfaces.

The measuring instrument is particularly compact and portable and the built-in battery means that it can be used even without an external power supply.

• Automatic positioning: The measuring probe is automatically positioned on the workpiece surface. 
• Simple operation: The motorised probe lowering function means you simply need to position the traverse unit and start the measurement. 
• Protecting probe for longevity: On completion of the measurement, the probe arm lifts up from the workpiece automatically. This protects the probe tip from damage.
• Verify: Test the measuring system with the integrated roughness standard.
• Safe: Motorised probe lowering protects the roughness probe and automatically sets the measuring range
• Mobile use: Compact traverse unit with skidless probe system.
• Integrated printer: Print out results immediately so you can display your measurement results in graph form. 
• Easy to use: Clear and transparent thanks to the large, colour touchscreen with context-sensitive probe functions.
• Informative: Display parameters, profile graphics, Abbott curves and statistical data.
• Versatile: Extensive range of accessories for individual measuring tasks.
• Transverse probing: 90° tilting of the probe for measurements in grooves.
• Integrated rest and barrel jack: For secure storage of the traverse unit and protection of the probe and automatic battery charging function.
• Measurement in all positions: Measurement of small workpieces in the overhead position.
• Integrated height adjustment: Extendable tripod legs for adjusting the traverse unit to the height of small workpieces.
• Mobile reference plane measurements: Performs reference plane measurements and determines the unfiltered P as well as W parameters.