Jenoptik Waveline W900

Stationary roughness and contour measurement system

Fast measuring axes guarantee short measuring cycles in complex measurement tasks, meeting the most stringent requirements of measurement technology.

Leading quality in roughness, radius, angle and diameter measurements. W900 measuring systems are used mainly in the field of automated measurement to obtain extremely rapid results.

In conjunction with the Nanoscan probe system, the high-precision traverse unit provides excellent measuring accuracy in combined roughness and contour measurements.

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